EFFECTS OF AVALANCHE INJECTION CURRENTS ON THE ENDURANCE OF Si MOS DEVICES.

Chih Tang Sah*, Jach Yuan Chen Sun, Josheph Jeng Tao Tzou

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations
Original languageEnglish
Pages (from-to)753
Number of pages1
JournalTechnical Digest - International Electron Devices Meeting
DOIs
StatePublished - 1982

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