Effect of temperature and illumination on the instability of a-Si:H thin-film transistors under AC gate bias stress

C. Y. Huang*, T. H. Teng, C. J. Yang, C. H. Tseng, Huang-Chung Cheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

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Physics & Astronomy

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