Effect of passivation layer on the thin film perovskite random lasers

Subha Prakash Mallick, Yu Heng Hong, Lih Ren Chen, Tsung-Sheng Kao, Tien Chang Lu*

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Novel functionalities of disorder-induced scattering effect in random lasers, attributed to low spatial coherence, draw remarkable attention in high-contrast to superior quality speckle-free imaging applications. This paper demonstrates perovskite-polystyrene (PS)-based random lasing action with robust optical performance at room temperature. Optical characterizations are carried out upon perovskite thin films addition with polystyrene of different mixing concentrations (wt. %). A low threshold lasing operation is achieved with an increasing concentration of polystyrene, accompanying a wavy surface texture with high surface roughness. The rough surface dominating multiple scattering effects leads to enhanced feedback efficiency. Moreover, this study also elucidates efficient fabrication process steps for the development of high quality and durable PS-based random lasers. With the advantages of reduced coherent artifacts and low spatial coherence, speckle free projection images of the USAF (U. S. Air Force MIL-STD-150A standard of 1951) resolution test chart are shown for different PS-based random lasers.

Original languageEnglish
Article number2322
JournalMaterials
Volume13
Issue number10
DOIs
StatePublished - 1 May 2020

Keywords

  • Multiple scattering effect
  • Passivation layer
  • Perovskite
  • Random lasers
  • Speckle free image projection

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