Effect of electron-phonon scattering on shot noise in nanoscale junctions

Yu-Chang Chen*, Massimiliano Di Ventra

*Corresponding author for this work

Research output: Contribution to journalArticle

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Abstract

We investigate the effect of electron-phonon inelastic scattering on shot noise in nanoscale junctions in the regime of quasiballistic transport. We predict that when the local thermal energy of the junction is larger than its lowest vibrational mode energy eVc, the inelastic contribution to shot noise (conductance) increases (decreases) with bias as V (V). The corresponding Fano factor thus increases as V. We also show that the inelastic contribution to the Fano factor saturates with increasing thermal current exchanged between the junction and the bulk electrodes to a value which, for VVc, is independent of bias. These predictions can be readily tested experimentally.

Original languageEnglish
Article number166802
JournalPhysical Review Letters
Volume95
Issue number16
DOIs
StatePublished - 14 Oct 2005

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