Effect of a surface layer on the investigation of AuFe alloys by transmission electron microscopy

Chen Chia Chou*, Haydn Chen, C. M. Wayman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

A surface layer on as-jet-polished AuFe alloys was found. This layer influences the images of specimens investigated, which accordingly show a dynamical flickering phenomenon. However, lobe and/or rod-shaped precipitates contrasts were revealed once the specimens were further cleaned by an ion miller. Auger electron spectroscopy was employed to study the surface layer. Compared with a specimen after ion milling, a layer of chromium oxide about 20-30 Å thick was found to exist on the surfaces of as-jet polished specimens. This may be the reason why previous studies on AuFe alloys failed to show any significant features in transmission electron microscopy. On the other hand, the present results suggest the possibility of the coexistence of Fe clustering and short-range ordering from both real and reciprocal spaces information.

Original languageEnglish
Pages (from-to)85-91
Number of pages7
JournalMaterials Characterization
Volume26
Issue number2
DOIs
StatePublished - 1 Jan 1991

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