Edge diffraction induced near-field contrast in subwavelength structures

Hsieh Li Chou, Yi-Chun Chen, Pei Kuen Wei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Optical near-field in subwavelength air-dielectric structure is studied by a collection-mode nearfield optical microscopy. Concentrated optical near-field and large polarization anisotropy at the dielectric regions are measured. From the simulation of finite-difference time-domain method, we conclude the edge diffraction dominating the optical near-field distribution.

Original languageEnglish
Title of host publicationCLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics
Subtitle of host publicationPhotonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages1
ISBN (Electronic)0780377664
DOIs
StatePublished - 1 Jan 2003
Event5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 - Taipei, Taiwan
Duration: 15 Dec 200319 Dec 2003

Publication series

NamePacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Volume1

Conference

Conference5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003
CountryTaiwan
CityTaipei
Period15/12/0319/12/03

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    Chou, H. L., Chen, Y-C., & Wei, P. K. (2003). Edge diffraction induced near-field contrast in subwavelength structures. In CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings [1274585] (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2003.1274585