Dynamic analog testing via ATE digital test channels

Chau-Chin Su, C. S. Chang, H. W. Huang, D. S. Tu, C. L. Lee, Jerry C.H. Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

A dynamic analog test methodology using digital tester is proposed. A simple triangular waveform is built on the device interface board for the stimulus generation. The response waveform is quantized by the dual comparators in a digital pin electronic circuit. Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results using an ATE show that the error is less than 2%. It confirms the feasibility of the proposed methodology.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium, ATS'04
Pages308-312
Number of pages5
DOIs
StatePublished - 1 Dec 2004
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
Duration: 15 Nov 200417 Nov 2004

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Conference

ConferenceProceedings of the Asian Test Symposium, ATS'04
CountryTaiwan
CityKenting
Period15/11/0417/11/04

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