Dual greedy: Adaptive garbage collection for page-mapping solid-state disks

Wen Huei Lin*, Li-Pin Chang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Scopus citations

Abstract

In the recent years, commodity solid-state disks have started adopting powerful controllers and implemented page-level mapping for flash management. However, many of these models still use primitive garbage-collection algorithms, because prior approaches do not scale up with the dramatic increase of flash capacity. This study introduces Dual Greedy for garbage collection in page-level mapping. Dual Greedy identifies page-accurate data hotness using only block-level information, and adaptively switches its preference of victim selection between block space utilization and block stability. It can run in constant time and use very limited RAM space. Our experimental results show that Dual Greedy outperforms existing approaches in terms of garbage-collection overhead, especially with large flash blocks.

Original languageEnglish
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
Pages117-122
Number of pages6
DOIs
StatePublished - 24 May 2012
Event15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 - Dresden, Germany
Duration: 12 Mar 201216 Mar 2012

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
CountryGermany
CityDresden
Period12/03/1216/03/12

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    Lin, W. H., & Chang, L-P. (2012). Dual greedy: Adaptive garbage collection for page-mapping solid-state disks. In Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 (pp. 117-122). [6176443] (Proceedings -Design, Automation and Test in Europe, DATE). https://doi.org/10.1109/DATE.2012.6176443