Direct observation of electron dephasing due to inelastic scattering from defects in weakly disordered AuPd wires

Yuan Liang Zhong*, Andrei Sergeev, Chii Dong Chen, Juhn-Jong Lin

*Corresponding author for this work

Research output: Contribution to journalArticle

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Abstract

To identify and investigate the mechanisms of electron-phonon (e-ph) relaxation in weakly disordered metallic conductors, we measure the electron dephasing rate in a series of suspended and supported 15-nm thick AuPd wires. In a wide temperature range, from ∼8K to above 20 K, the e-ph interaction dominates in the dephasing processes. The corresponding relaxation rate reveals a quadratic temperature dependence, τe-ph-1=AepT2, where Aep 5×109K-2s-1 is essentially the same for all samples studied. Our observations are shown to be in good agreement with the theory which predicts that, even in weakly disordered metallic structures at moderately low temperatures, the major mechanism of the e-ph relaxation is the electron scattering from vibrating defects and impurities.

Original languageEnglish
Article number206803
JournalPhysical Review Letters
Volume104
Issue number20
DOIs
StatePublished - 20 May 2010

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