Dielectric properties of Zn1-xMnxTe epilayers

S. P. Fu*, Y. F. Chen, J. C. Wang, J. L. Shen, Wu-Ching Chou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations


The dielectric properties of Zn1-xMnxTe epilayers were investigated. The capacitance and dissipation factor measurements were taken at a temperature of 200 K<T<460 K and a frequency of 20 Hz<f<1 MHz. The analysis showed a Debye-like relaxation in the dielectric response of Zn1-xMnxTe epilayers which was explained in terms of the presence of charge redistribution.

Original languageEnglish
Pages (from-to)2140-2144
Number of pages5
JournalJournal of Applied Physics
Issue number4
StatePublished - 15 Feb 2003

Fingerprint Dive into the research topics of 'Dielectric properties of Zn<sub>1-x</sub>Mn<sub>x</sub>Te epilayers'. Together they form a unique fingerprint.

Cite this