Dielectric properties of the compositionally graded (Ba,Sr)TiO3 thin film

Jiwei Zhai*, X. I. Yao, Liangying Zhang, Bo Shen, Haydn Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations


The compositionally graded Ba1-xSrxTiO3 films with a fine compositional gradient from BaTiO3 to Ba 0.70Sr0.30TiO3 were fabricated on Pt/Ti/SiO2/Si substrates by a sol-gel deposition method. The graded films crystallized into a pure perovskite structure after post-deposition annealing. Dielectric constant peaks, common to a ferroelectric transition, were not observed in the temperature range from -35°C to 190°C, within which the dielectric constant and dielectric loss showed negligible temperature dependence. The unproved temperature stability from this type of compositionally graded material is beneficial to applications requiring a wide range of operating temperatures, thereby eliminating the need for environmental controls.

Original languageEnglish
Pages (from-to)43-48
Number of pages6
StatePublished - 1 Dec 2005


  • BST thin films
  • Composition gradient
  • Dielectric property
  • Sol-gel

Fingerprint Dive into the research topics of 'Dielectric properties of the compositionally graded (Ba,Sr)TiO<sub>3</sub> thin film'. Together they form a unique fingerprint.

Cite this