Dielectric properties of CdxZn1-xTe epilayers

K. F. Wang, S. P. Fu, Y. F. Chen*, J. L. Shen, Wu-Ching Chou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A report on the dielectric properties of CdxZn1-xTe epilayers was presented. The dielectric properties were studied by capacitance and dissipation factor measurements at temperature 201 K<T<460 K and frequency 20 Hz<f<1 MHz. It was found that the activation energy decreases with increasing Cd content.

Original languageEnglish
Pages (from-to)3371-3375
Number of pages5
JournalJournal of Applied Physics
Volume94
Issue number5
DOIs
StatePublished - 1 Sep 2003

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