Dielectric properties of Ba(SnxTi1-x)O3 thin films grown by a sol-gel process

Jiwei Zhai*, Bo Shen, Xi Yao, Liangying Zhang, Haydn Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

Ferroelectric Ba(SnxTi1-x)O3 (BTS) thin films were deposited using a sol-gel process on LaNiO3-coated silicon substrates. The films showed a (100) preferred orientation depending on composition. The grain size decreased and the microstructure became denser with increasing tin content The decreasing grain size with increasing tin may be attributable to lower grain-growth rates from the more slowly diffusing Sn 4+ ion, which has a larger ionic radius than Ti4+. The ferroelectric phase transition temperature of Ba(SnxTi 1-x)O3 thin films with (a) x = 0, (b) x = 0.05, (c) x = 0.10, and (d) x = 0.15 occurs at about 150°, 45°, 28°, and 20°C, respectively. The highest K (figure of merit defined as K = tunability/tan δ = {[ε(0) - ε(E)]/ε(E)}/tan δ) was found for BTS thin films with x = 0.10, even though tunability was highest with x = 0.05. An increase of dielectric loss as compared with films with x = 0.10 produced a decrease in K value. The J-E characteristics were highly nonlinear and the electric field resulting in nonlinearity moved to lower electric fields with decreasing tin content.

Original languageEnglish
Pages (from-to)2223-2227
Number of pages5
JournalJournal of the American Ceramic Society
Volume87
Issue number12
DOIs
StatePublished - 1 Jan 2004

Fingerprint Dive into the research topics of 'Dielectric properties of Ba(Sn<sub>x</sub>Ti<sub>1-x</sub>)O<sub>3</sub> thin films grown by a sol-gel process'. Together they form a unique fingerprint.

Cite this