## Abstract

The dielectric confinement effect on the blue shift ΔE_{g}(a) of the ZnO quantum dots (QDs) embedded in the SiO_{2} matrix is evaluated by applying a multi-shell two-electron system model. The experimental measurement and the calculations of various dielectric structures indicate that the composite matrix structure provides a better estimation of the blue shift of the ZnO QDs-SiO_{2} system than the multi-shell structure. The proportionality factor x defined in this work exhibits a dependence of the dielectric confinement energy on the specific dimension ratio (the b/a ratio) and the dielectric constant ε_{matrix} of the outer matrix. The result of the calculation also shows the limit of the two-electron system in estimating the ground-state energy of samples with high dot density. However, the correlation shows the existence of the strong dielectric confinement effect in ZnO QDs-SiO_{2} thin films and allows a better understanding of the semiconductor QDs-dielectric systems.

Original language | English |
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Article number | 046 |

Pages (from-to) | 6071-6075 |

Number of pages | 5 |

Journal | Journal of Physics D: Applied Physics |

Volume | 40 |

Issue number | 19 |

DOIs | |

State | Published - 7 Oct 2007 |