Diagnosis and Repair of Memory with Coupling Faults

Ming-Feng Chang, W. Kent Fuchs, Janak H. Patel

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

This paper addresses the problem of diagnosis and spare allocation for random access memory (RAM) with coupling faults. A number of spare allocation algorithms for RAM with row and column redundancy have recently been proposed. These procedures, however, have been restricted to repairing stuck-at faults. This paper is unique in that it examines both diagnosis and repair of coupling faults in RAM's utilizing spare rows and columns. In this paper, we show that a coupling fault is repaired if its coupling cell is replaced by utilizing a spare row or its coupled cell is replaced by utilizing a spare row or column. By specifying both the coupled cell and coupling cell, the amount of redundancy required to repair a given set of faults may be reduced. A diagnosis procedure for RAM is provided to locate stuck-at faults as well as coupling faults. A graph model is employed to describe the repair of coupling faults and a repair procedure has been implemented to allocate rows and columns for repair.

Original languageEnglish
Pages (from-to)493-500
Number of pages8
JournalIEEE Transactions on Computers
Volume38
Issue number4
DOIs
StatePublished - 1 Jan 1989

Keywords

  • Coupling faults
  • diagnosis
  • memory fault location
  • memory repair

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