Developing a microspectrophotometer to measure the dependence of broadband refractive indices on Ge-doped concentrations in GRIN rods

Chun Jen Weng, Ken-Yuh Hsu, Cheng Yeh Lee, Yung-Fu Chen

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

A confocal microspectrophotometer is utilized to scan the surface reflectivities of a polished gradient-index (GRIN) rod in the range of 400 to 900 nm. The pure fused silica is used to be a reference standard for deducing the absolute reflectivities of the Ge-doped core. Then, multiwavelength refractive index profiles of the Ge-doped core can be further determined based on the Fresnel equation. Moreover, this work shows a connection between the material dispersion of the GRIN rod and the Gedoped concentrations measured by an energy dispersive spectrometer. Finally, the dependence of the refractive index of the Ge-doped core on the doping concentrations at a certain wavelength can be easily expressed as a linear form.

Original languageEnglish
Pages (from-to)30815-30820
Number of pages6
JournalOptics Express
Volume23
Issue number24
DOIs
StatePublished - 30 Nov 2015

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