Determination Of Carrier Lifetime From Rectifier Ramp Recovery Waveform

Ben Tien, Chen-Ming Hu

Research output: Contribution to journalArticlepeer-review

30 Scopus citations


A charge-control analysis has been used to obtain an expression relating the carrier lifetime to the realistic ramp recovery waveform of a p-i-n diode of arbitrary softness. The method has been shown to produce a consistent lifetime for different values of forward currents, current ramp rates, and the resultant softness factors.

Original languageEnglish
Pages (from-to)553-555
Number of pages3
JournalIEEE Electron Device Letters
Issue number10
StatePublished - 1 Jan 1988

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