Detection and location for single faults in bitonic sorters

Tsern-Huei Lee*, Jin Jye Chou

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Bitonic sorters have recently been adopted to construct along with banyan networks the switching fabrics of future broadband networks. Unfortunately, a single fault in the bitonic sorter may become a disaster to the switching system. Therefore, a bitonic sorter must be proved to be free of faults before it can be used. In this paper we present an efficient fault diagnosis procedure to detect and locate single faults in bitonic sorters without state control lines. Our diagnosis procedure can detect most single faults in two tests. The faults which cannot be detected in two tests can always be detected in four tests. Several binary search techniques are developed to locate a faulty sorting element (i.e., 2 × 2 sorter.)

Original languageEnglish
Title of host publicationConference Record - International Conference on Communications
PublisherPubl by IEEE
Pages425-431
Number of pages7
ISBN (Print)0780318269
DOIs
StatePublished - 1 Jan 1994
EventProceedings of the 1994 IEEE International Conference on Communications - New Orleans, LA, USA
Duration: 1 May 19945 May 1994

Publication series

NameConference Record - International Conference on Communications
Volume1
ISSN (Print)0536-1486

Conference

ConferenceProceedings of the 1994 IEEE International Conference on Communications
CityNew Orleans, LA, USA
Period1/05/945/05/94

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