Design of high-performance and highly reliable nMOSFETs with embedded Si:C S/D extension stressor(Si:C S/D-E)

Steve S. Chung, E. R. Hsieh, P. W. Liu, W. T. Chiang, S. H. Tsai, T. L. Tsai, R. M. Huang, C. H. Tsai, W. Y. Teng, C. I. Li, T. F. Kuo, Y. R. Wang, C. L. Yang, C. T. Tsai, G. H. Ma, S. C. Chien, S. W. Sun

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

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Engineering & Materials Science