RF/High-Speed I/O ESD Protection: Co-optimizing Strategy Between BEOL Capacitance and HBM Immunity in Advanced CMOS Process

Wei Min Wu, Ming-Dou Ker*, Shih Hung Chen, Jie Ting Chen, Dimitri Linten, Guido Groeseneken

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

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Chemical Compounds

Engineering & Materials Science