Design and control of tapping mode atomic force microscope in liquid utilizing optical pickup system

Wan Lin Hu*, Shao-Kang Hung, Li Chen Fu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, we propose a fluid tapping mode atomic force microscopy (AFM) implemented by a DVD pickup head. The use of DVD pickup head minimizes the volume of the hardware system, and thus reduces the measurement error caused by heat expansion. In order to realize the system mentioned above, we design a Q-controller to modulate the interaction force between the tip and the sample. Increasing the quality factor will overcome the problem with high damping ratio in the fluid which makes the probe hard to oscillate. Because of the reduction of the tip-sample force, the sample surface will not be hurt by the tip. Therefore, we can use the AFM to scan soft sample, and obtain more realistic topography. Traditionally, people use proportion-integration controller to control the system. Users need to tune this kind of controller manually, and hence the quality of the scan images is highly related to users' experiences. To overcome this problem, we design an adaptive sliding-mode controller to improve the scanning capability and robustness.For testing the system capability, we will have a series of numerical simulations.

Original languageEnglish
Title of host publication2008 International Conference on Control, Automation and Systems, ICCAS 2008
Pages783-788
Number of pages6
DOIs
StatePublished - 1 Dec 2008
Event2008 International Conference on Control, Automation and Systems, ICCAS 2008 - Seoul, Korea, Republic of
Duration: 14 Oct 200817 Oct 2008

Publication series

Name2008 International Conference on Control, Automation and Systems, ICCAS 2008

Conference

Conference2008 International Conference on Control, Automation and Systems, ICCAS 2008
CountryKorea, Republic of
CitySeoul
Period14/10/0817/10/08

Keywords

  • Adaptive sliding-mode control
  • Atomic force microscope (AFM)
  • Q-control
  • Tapping mode

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