Degradation of low temperature polycrystalline silicon thin film transistors under negative bias temperature instability stress with illumination effect

Chia Sheng Lin*, Ying Chung Chen, Ting Chang Chang, Hung Wei Li, Wei Che Hsu, Shih Ching Chen, Ya-Hsiang Tai, Fu Yen Jian, Te Chih Chen, Kuan Jen Tu, Hsing Hua Wu, Yi Chan Chen

*Corresponding author for this work

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