Degradation of InGaN-based laser diodes analyzed by means of electrical and optical measurements

M. Meneghini*, N. Trivellin, K. Orita, S. Takigawa, T. Tanaka, Daisuke Ueda, G. Meneghesso, E. Zanoni

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Abstract

In this paper we present a detailed analysis of the degradation of InGaN-based laser diodes carried out by means of electrical and optical techniques. The study is based on the comparison between the degradation kinetics of laser diodes and light-emitting diode (LED)-like samples, i.e., devices with the same epitaxial structure as the lasers, but with no ridge and facets. Results described in the following indicate that degradation of lasers and LED-like samples is due to the same mechanism, possibly involving the generation of point defects within the active region of the devices. Furthermore, since degradation occurs both in lasers and in LED-like samples (i.e., structures with no current confinement), results suggest that degradation of lasers is not correlated with the geometry of the devices, nor to worsening of current confinement under the ridge.

Original languageEnglish
Article number263501
JournalApplied Physics Letters
Volume97
Issue number26
DOIs
StatePublished - 27 Dec 2010

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