Degradation of AlGaInP light emitting diodes under reverse-bias operations in salty water vapor

Hsiang Chen*, Li Chen Chu, Ming Ling Lee, Nai Chung Kang, Shih Chang Shei, Hung Wei Chang, Yu Cheng Chu, Huan Yu Shen, Chin Pang Chen, Kow-Ming Chang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

GaP-based light emitting diodes (LEDs) reliability tests are crucial to further development for high-performance LED lighting technology. In this study, we perform reverse-bias stress tests for LEDs in water vapor and salty water vapor ambient, respectively. The results indicate that salty water vapor can quickly degrade LEDs. To investigate the failure mechanisms, electrical measurements, forward-bias and reverse-bias electroluminescence images, and multiple material analyses have been taken to study the failure mechanism. Results indicate that NaCl clustering solids and atom diffusion may cause deformation of the electrode and enhance the degradation of the LEDs.

Original languageEnglish
Pages (from-to)13-16
Number of pages4
JournalVacuum
Volume118
DOIs
StatePublished - 1 Aug 2015

Keywords

  • AlGaInP LED
  • Atom diffusion
  • NaCl clustering solids
  • Reverse-bias
  • Salty water vapor

Fingerprint Dive into the research topics of 'Degradation of AlGaInP light emitting diodes under reverse-bias operations in salty water vapor'. Together they form a unique fingerprint.

Cite this