Defect-free half-V-mode ferroelectric liquid-crystal device

Chi Wen Lin*, Huang-Ming Chen

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

The horizontal chevron defect found in a half-V-mode ferroelectric-liquid- crystal (HV-FLC) device can be suppressed by lowering the FLC's total free energy. The energy levels between spontaneous polarization (PS) up and down domains were degenerated by asymmetrical-alignment treatments. The difference in the polar surface coefficient (γ2) was the key to suppressing the alignment defect. Alignment layers with opposite surface polarities and different anchoring energies were applied to control the sign and value of γ2. The asymmetric cells of Plrub - Plplasma (rubbed polyimide and plasma-treated polyimide surfaces), PVArub - Pl plasma (rubbed polyvinyl alcohol and plasma-treated polyimide surfaces), and PVArub - Plrub (both rubbed PI and PVA) alignment conditions presented defect-free alignment textures under a slow-cooling process. Among these different alignment treatments, the PVA rub - Plrub treated cell demonstrated the best alignment result, benefited by the largest difference in polar surface coefficient.

Original languageEnglish
Pages (from-to)976-980
Number of pages5
JournalJournal of the Society for Information Display
Volume18
Issue number11
DOIs
StatePublished - 1 Nov 2010

Keywords

  • Alignment defect
  • Ferroelectric liquid crystal
  • Half-V-mode FLC
  • Horizontal chevron defect

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