@inproceedings{06065de321114b72af061a71f8fad9d0,
title = "Cycling induced degradation of a 65nm FPGA Flash memory switch",
abstract = "We present a study of cycling induced degradation of a two transistor Flash memory cell with a shared floating gate. The cell directly serves as a configurable interconnection switch in a Field Programmable Gate Array (FPGA) fabricated with a 65 nm embedded-Flash process. By optimizing the poly re-oxidation, LDD implant and spacer module, the cell endurance is significantly improved at both the single cell and 1 Mbit test-array levels.",
author = "Schmid, {Ben A.} and Jia, {James Yingbo} and Jonathan Wolfman and Yu Wang and Fethi Dhaoui and Tseng, {Huan Chung} and Kim, {Sung Rae} and Lee, {Kin Sing} and Patty Liu and Han, {Kyung Joon} and Chen-Ming Hu",
year = "2010",
month = dec,
day = "1",
doi = "10.1109/IIRW.2010.5706495",
language = "English",
isbn = "9781424485246",
series = "IEEE International Integrated Reliability Workshop Final Report",
pages = "92--94",
booktitle = "2010 IEEE International Integrated Reliability Workshop Final Report, IIRW 2010",
note = "null ; Conference date: 17-10-2010 Through 21-10-2010",
}