Abstract
Crosstalk between single-photon avalanche diodes (SPADs) fabricated by the standard CMOS process is extensively investigated. The dependence of device structure, device-to-device distance, and bias voltage on crosstalk has been experimentally studied. Our work reveals that direct-path optical crosstalk dominates in these CMOS SPADs, which is also confirmed with the first time-correlated crosstalk measurement. This work is valuable for SPAD array design and optimization in CMOS technology.
Original language | English |
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Pages (from-to) | 833-837 |
Number of pages | 5 |
Journal | Journal of Lightwave Technology |
Volume | 36 |
Issue number | 3 |
DOIs | |
State | Published - 1 Feb 2018 |
Keywords
- Breakdown flash
- CMOS technology
- crosstalk
- single-photon avalanche diodes