Critical voltage reduction by alignment layer modification in Pi-cells

Wei Ching Wu*, Yi Fan Chen, Szu Fen Chen, Huang-Ming Chen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A new approach which can effectively lower the critical voltage (Vcr) of π cell has been realized in this study. New structure of π cell can increase the control range of driving voltage, which makes the gray scale manipulation near Vcr more stable without loosing the fast response property.

Original languageEnglish
Title of host publicationIDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings
Pages692-694
Number of pages3
StatePublished - 1 Dec 2007
EventInternational Display Manufacturing Conference and Exhibition, IDMC 2007 - Taipei, Taiwan
Duration: 3 Jul 20076 Jul 2007

Publication series

NameIDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings

Conference

ConferenceInternational Display Manufacturing Conference and Exhibition, IDMC 2007
CountryTaiwan
CityTaipei
Period3/07/076/07/07

Fingerprint Dive into the research topics of 'Critical voltage reduction by alignment layer modification in Pi-cells'. Together they form a unique fingerprint.

  • Cite this

    Wu, W. C., Chen, Y. F., Chen, S. F., & Chen, H-M. (2007). Critical voltage reduction by alignment layer modification in Pi-cells. In IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings (pp. 692-694). (IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings).