Critical length of electromigration for eutectic SnPb solder stripe

C. C. Wei, Chih Chen*

*Corresponding author for this work

Research output: Contribution to journalArticle

23 Scopus citations

Abstract

The critical length of eutectic SnPb solder was investigated using solder stripes. By employing focus ion beam, solder stripes of various lengths, including 5, 10, 15, 20, 30, 100, and 200 μm, can be fabricated. Length-dependent electromigration behavior was observed, which implies that there may be back stress under stressing. The critical length was determined to be between 10 and 15 μm under stressing by 2× 104 A cm2 at 100 °C, and the corresponding critical product was between 20 and 30 Acm. Both values show good agreement with their theoretical values.

Original languageEnglish
Article number182105
JournalApplied Physics Letters
Volume88
Issue number18
DOIs
StatePublished - 1 May 2006

Fingerprint Dive into the research topics of 'Critical length of electromigration for eutectic SnPb solder stripe'. Together they form a unique fingerprint.

  • Cite this