Control charts for the lognormal mean

Wei Heng Huang, Hsiuying Wang*, Arthur B. Yeh

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Among a set of tools that form the core of statistical process control, statistical control charts are most commonly used for controlling, monitoring, and improving processes. The conventional control charts are based on the assumption that the distribution of the quality characteristic to be monitored follows the normal distribution. However, in real applications, many process distributions may follow a positively skewed distribution such as the lognormal distribution. In this study, we discuss the construction of several control charts for monitoring the mean of the lognormal distribution. A real example is used to demonstrate how these charts can be applied in practice.

Original languageEnglish
Pages (from-to)1407-1416
Number of pages10
JournalQuality and Reliability Engineering International
Volume32
Issue number4
DOIs
StatePublished - 1 Jun 2016

Keywords

  • X -chart
  • average run length
  • lognormal distribution

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