Construction of a near-field spectrum analysis system using bent tapered fiber probes

Sy Hann Chen*, Yung-Fu Chen

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

We take advantage of a combination of laser heating and pulling and electric arc bending to fabricate bent tapered fiber probes. The bent angles can be varied from 30° to 70° and tip diameters fall within a few tens of nanometers. These bent fiber probes can easily be adapted into any dynamic mode atomic force microscope. By proper manipulation of the bent angles, a spatial resolution of up to 60 nm is achievable. After coating the bent fiber probes with a thin layer of Pt/Pd film by ion sputtering, the transmission efficiency is measured to be around 10-5, which is applicable for near-field spectrum analysis experiment.

Original languageEnglish
Pages (from-to)268-270
Number of pages3
JournalReview of Scientific Instruments
Volume72
Issue number1 I
DOIs
StatePublished - 1 Jan 2001

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