Constant Excess Bias Control for Single-Photon Avalanche Diode Using Real-Time Breakdown Monitoring

Po Hsuan Chang, Chia-Ming Tsai*, Jau Yang Wu, Sheng-Di Lin, Ming Ching Kuo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

A monolithic constant excess bias control circuit for single-photon avalanche diode (SPAD) in standard 0.18-μ m CMOS technology is reported. The proposed real-time breakdown monitoring technique is incorporated into a passive-quenching-active-reset circuit. A sample-and-hold circuit samples the breakdown level of SPAD through well-defined sampling phase. Following the sample-and-hold circuit, the level shifter with voltage shifting defined by predetermined excess bias provides the reset voltage of SPAD. The design operates the SPAD under constant excess bias and effectively mitigates the impact of the process-voltage-temperature variation by maintaining the optimal excess bias condition.

Original languageEnglish
Article number7138576
Pages (from-to)859-861
Number of pages3
JournalIEEE Electron Device Letters
Volume36
Issue number8
DOIs
StatePublished - 1 Aug 2015

Keywords

  • avalanche
  • diode
  • single-photon

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