Confidence-based reliability evaluation of multistate production network with process improvement

Yun Ling Cho, Ping Chen Chang, Yi-Kuei Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper studies the process improvement issue to determine the defect rates for workstations to achieve in a production system. A confidence-based multistate production network is adopted to model the production system, where the output is required to satisfy the demand with a specified yield confidence. This yield confidence is the probability that the multistate production network produces greater output amount than a required demand. A discrete time Markov chain is proposed to construct this multistate production network. In particular, the production manager is asked to reduce the raw materials to a tightened input amount. To reduce the input as well as to satisfy the same demand and yield confidence, process improvement is therefore implemented to set the target defect rates of workstations. This target defect rate can be seen as a reference for a workstation to improve its quality. A benchmark example of tile production system is utilized to demonstrate the model building and process improvement. The benchmark example also shows that the process improvement can enhance the system reliability of the multistate production network.

Original languageEnglish
Title of host publicationProceedings - 21st ISSAT International Conference on Reliability and Quality in Design
EditorsHoang Pham
PublisherInternational Society of Science and Applied Technologies
Pages80-83
Number of pages4
ISBN (Electronic)9780991057627
DOIs
StatePublished - 1 Jan 2015
Event21st ISSAT International Conference on Reliability and Quality in Design - Philadelphia, United States
Duration: 6 Aug 20158 Aug 2015

Publication series

NameProceedings - 21st ISSAT International Conference on Reliability and Quality in Design

Conference

Conference21st ISSAT International Conference on Reliability and Quality in Design
CountryUnited States
CityPhiladelphia
Period6/08/158/08/15

Keywords

  • Multistate production network (MPN)
  • System reliability
  • Target defect rate
  • Yield confidence

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