Computer analysis of the significance of surface boundary conditions on the collection of α-induced charge

K. W. Terrilli*, Chen-Ming Hu, A. R. Neurether

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

We compare the collection of α-particle generated charge by collectors surrounded by either uniform reflecting or uniform absorbing surfaces as to two extreme cases of any real condition in IC's. The comparison for varying α-particle energies and collector sizes indicates that the differences in collected charge for the two cases is less than a factor of two if the α-particle strike is through the center of the collector. We show that the variation of collected charge with feature length is approximately linear in both cases. The effect of scaling on soft errors in static RAM's is discussed. It is assumed that the charge transport is by diffusion only.

Original languageEnglish
Pages (from-to)15-18
Number of pages4
JournalSolid State Electronics
Volume26
Issue number1
DOIs
StatePublished - 1 Jan 1983

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