Comprehensive interconnect BIST achieves 100% fault coverage on net faults and drivers faults without any prerequisitive assumption on the connection configuration and the fault-free and faulty behavior of the interconnects. Guidelines are derived and structure maps are proposed to achieve the goal.
|Number of pages||5|
|Journal||Proceedings of the Asian Test Symposium|
|State||Published - 1 Dec 1998|
|Event||Proceedings of the 1998 7th Asian Test Symposium - Singapore, Singapore|
Duration: 2 Dec 1998 → 4 Dec 1998