Comprehensive interconnect BIST methodology for virtual socket interface

Chau-Chin Su*, Yue Tsung Chen

*Corresponding author for this work

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

Comprehensive interconnect BIST achieves 100% fault coverage on net faults and drivers faults without any prerequisitive assumption on the connection configuration and the fault-free and faulty behavior of the interconnects. Guidelines are derived and structure maps are proposed to achieve the goal.

Original languageEnglish
Article number6294676
Pages (from-to)259-263
Number of pages5
JournalProceedings of the Asian Test Symposium
DOIs
StatePublished - 1 Dec 1998
EventProceedings of the 1998 7th Asian Test Symposium - Singapore, Singapore
Duration: 2 Dec 19984 Dec 1998

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