Comparison of p control charts for low defective rate

Hsiuying Wang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

It is well known that the conventional p control chart constructed by the normal approximation for the binomial distribution suffers a serious inaccuracy in the monitor process when the true rate of nonconforming items is small. A similar problem also arises in the binomial confidence interval estimation. Adjusted confidence intervals are established in the literature to improve the coverage probability when the binomial proportion is small. In this paper, a new p control chart based on an adjusted confidence interval is established, which can substantially improve the existing control charts when the nonconforming rate is small.

Original languageEnglish
Pages (from-to)4210-4220
Number of pages11
JournalComputational Statistics and Data Analysis
Volume53
Issue number12
DOIs
StatePublished - 1 Oct 2009

Fingerprint Dive into the research topics of 'Comparison of p control charts for low defective rate'. Together they form a unique fingerprint.

Cite this