Compact layout rule extraction for latchup prevention in a 0.25-μm shallow-trench-isolation silicided bulk CMOS process

Ming-Dou Ker, Wen Yu Lo, Tung Yang Chen, Howard Tang, S. S. Chen, M. C. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

An experimental extraction to find the area-efficient compact layout rules to prevent latchup in bulk CMOS IC's is proposed. The layout rules are extracted from the test patterns with different layout spacings or distances. A new efficient latchup prevention design, by adding the additional internal guard rings between the I/O cells and the internal core circuits, has been successfully proven in a 0.25-μim shallow-trench-isolation (STI) silicided bulk CMOS process. Through detailed experimental verification including temperature effect, the proposed extraction method to define compact layout rules has been established to save the silicon area of CMOS IC's, but still to maintain high enough latchup immunity in bulk CMOS IC's.

Original languageEnglish
Title of host publicationProceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design, ISQED 2001
PublisherIEEE Computer Society
Pages267-272
Number of pages6
ISBN (Electronic)0769510256
DOIs
StatePublished - 1 Jan 2001
Event2nd IEEE International Symposium on Quality Electronic Design, ISQED 2001 - San Jose, United States
Duration: 26 Mar 200128 Mar 2001

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2001-January
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference2nd IEEE International Symposium on Quality Electronic Design, ISQED 2001
CountryUnited States
CitySan Jose
Period26/03/0128/03/01

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    Ker, M-D., Lo, W. Y., Chen, T. Y., Tang, H., Chen, S. S., & Wang, M. C. (2001). Compact layout rule extraction for latchup prevention in a 0.25-μm shallow-trench-isolation silicided bulk CMOS process. In Proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design, ISQED 2001 (pp. 267-272). [915241] (Proceedings - International Symposium on Quality Electronic Design, ISQED; Vol. 2001-January). IEEE Computer Society. https://doi.org/10.1109/ISQED.2001.915241