Combined Effects of Light Illumination and Various Bottom Gate Length on the Instability of Via-Contact-Type Amorphous InGaZnO Thin-Film Transistors

Chung I. Yang, Ting Chang Chang*, Po Yung Liao, Bo Wei Chen, Wu-Ching Chou, Guan Fu Chen, Shin Ping Huang, Yu Zhe Zheng, Yu Xuan Wang, Hsi Wen Liu, Chien Yu Lin, Yu Shan Lin, Ying Hsin Lu, Shengdong Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Chemical Compounds

Engineering & Materials Science