Successful circuit design to achieve the whole-chip electrostatic discharge (ESD) protection for an UXGA/HDTV LCoS IC product with a die size of 20289.6μm × 16841.5μm has been proposed and practically verified in 0.35-μm 3.3V/12V CMOS process. This LCoS IC with both of low-voltage (LV) and high-voltage (HV) ESD protection circuits can sustain ESD stresses of 3.5kV and 200V in human-body-model (HBM) and machine-model (MM) ESD test standards, respectively.
|Number of pages||4|
|State||Published - 1 Dec 2004|
|Event||2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology - Tainan, Taiwan|
Duration: 6 Dec 2004 → 9 Dec 2004
|Conference||2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology|
|Period||6/12/04 → 9/12/04|