ChiYun compact: A novel test compaction technique for responses with unknown values

Chia-Tso Chao*, Seongmoon Wang, Srimat T. Chakradhar, Kwang Ting Cheng

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

This paper proposes a response compactor, named ChiYun compactor, to compact scan-out responses in the presence of unknown values. By adding storage elements into an Xor network, a ChiYun compactor can offer multiple chances for a scan-out response to be observed at ATE channels in one to several scan-shift cycles. We also develop a mathematical analysis to predict the percent-age of scan-out responses masked by the unknown values for the ChiYun compactor. With this analysis, we can derive the optimal, configuration of a ChiYun compactor for minimizing the masking of scan-out responses. We further propose a selection scheme for the ChiYun compactor to selectively observe partial Xor results for improving the fault coverage. The experimental results demonstrate the effectiveness of the proposed mathematical analysis and the selection scheme. We also demonstrate that the unknown tolerance of a ChiYun compactor is higher than that of a state-of-the-art response compactor proposed in [11].

Original languageEnglish
Title of host publicationProceedings - 2005 IEEE International Conference on Computer Design
Subtitle of host publicationVLSI in Computers and Processors, ICCD 2005
Pages147-152
Number of pages6
DOIs
StatePublished - 1 Dec 2005
Event2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005 - San Jose, CA, United States
Duration: 2 Oct 20055 Oct 2005

Publication series

NameProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
Volume2005
ISSN (Print)1063-6404

Conference

Conference2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005
CountryUnited States
CitySan Jose, CA
Period2/10/055/10/05

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