Characterization of write-once blu-ray disk containing Cu-Al/Si recording layer using transmission electron microscopy

Hung Chuan Mai, Tsung-Eong Hsien*, Shiang Yao Jeng

*Corresponding author for this work

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

Microstructure change in write-once blu-ray disk containing Cu-Al/Si recording layer was investigated by transmission electron microscopy. Nanoscale crystallites were found to comprise of the Cu-Al/Si recording layer before and after signal writing and the energy dispersive spectroscopy revealed insignificant composition fluctuation in disk sample. Analytical results indicated the signal properties of disk samples are correlated with a moderate improvement of crystallinity and the formation of Cu and Si solid-solution phases due to element mixing in mark area, rather than the formation of Cu 3 Si silicide and recrystallization of recording layer as reported by previous studies.

Original languageEnglish
Article number094103
JournalApplied Physics Letters
Volume98
Issue number9
DOIs
StatePublished - 28 Feb 2011

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