Characterization of the novel polysilicon TFT with a subgate coupling structure

Kow-Ming Chang*, Yuan Hung Chung, Chi Gun Deng, Yuan Fu Chung, Jian Hong Lin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


We have proposed and fabricated a novel polysilicon thin film transistor (poly-Si TFT) with a snbgate coupling structure that behaves as an offset gated structure in the OFF state while acting as a conventional nonoffset structure in the ON state. The OFF state leakage current of the new TFT is two orders of magnitude lower than that of the conventional nonoffset TFT, while the ON current of the new TFT is one order of magnitude higher than that of the offset TFT and is almost identical to that of the conventional non-offset TFT. The ON/OFF current ratio of the new TFT is greatly improved by two orders of magnitude. No additional photo-masking steps are required to fabricate the subgate of the new TFT and its fabrication process is fully the same as the conventional nonoffset TFTs.

Original languageEnglish
Article number992863
Pages (from-to)564-567
Number of pages4
JournalIEEE Transactions on Electron Devices
Issue number4
StatePublished - 1 Apr 2002


  • Offset gated structure
  • ON/OFF current ratio
  • Photomasking steps
  • Polysilicon thin film transistor (poly-Si TFT)
  • Subgate coupling structure

Fingerprint Dive into the research topics of 'Characterization of the novel polysilicon TFT with a subgate coupling structure'. Together they form a unique fingerprint.

Cite this