Characterization of Pb(ScTa)1-xTixO3 (x<0.3) thin films grown on LaNiO3 coated Si By MOCVD

Chun-Hsiung Lin*, Hao-Chung Kuo, G. E. Stillman, Haydn Chen

*Corresponding author for this work

Research output: Contribution to journalConference article

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