Characterization of Pb(ScTa)_1-xTi_xO₃ (x<0.3) thin films grown on LaNiO₃ coated Si By MOCVD

Chun-Hsiung Lin^*, Hao-Chung Kuo, G. E. Stillman, Haydn Chen

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

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