The delay-change curve (DCC) characterizes the variation the interconnect delay due to coupling noise. This paper describes a set of novel models that relate the DCC to the coupling noise waveform. These models are targeted for use in the timing margin design and accurate experimental determination of sub-nanosecond coupling noise. The circuit structure, a set of measurements, the model equations, and the waveform extraction procedures are newly proposed. Evaluation results using a 0.25-μm test chip are presented showing good agreement with SPICE simulations.
|Number of pages||5|
|Journal||Proceedings of the Annual IEEE International ASIC Conference and Exhibit|
|State||Published - 1 Jan 2000|
|Event||Proceedings of the 13th Annual IEEE International ASIC/SOC Conference - Arlington, VA, USA|
Duration: 13 Sep 2000 → 16 Sep 2000