Characteristics of Ba(Mg1/3Ta2/3)O3 thin films prepared by pulsed laser deposition process and their effect on the growth of Pb(Zr1-xTix)O3 thin films

I. Nan Lin*, Chen Wei Liang, Ying-hao Chu, Su Jien Lin

*Corresponding author for this work

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

The growth behavior of Ba(Mg1/3Ta2/3)O3 (BMT) thin films on bare or Pt-coated silicon substrates and their buffering effect on the subsequently deposited Pb(Zr,Ti)O3 (PZT) films were systematically examined. The preferred orientation of BMT layer varies pronouncedly with the deposition parameters. It is (200) textured when deposited under high substrate temperature (400°C) or large laser fluence (3 J/cm2). The BMT layer not only suppresses the film-to-substrate interdiffusion but also enhances the Pb(Zr1-xTix)O 3 (PZT) nucleation kinetics. The PZT films prepared on BMT layer by metal-organic-decomposition (MOD) process begin to crystallize at a substrate temperature as low as 400°C, which is lower than the reported heat treatment temperature for preparing PZT films via MOD process. However, postannealing at 550°C is required to fully crystallize the PZT films. The PZT/BMT/Pt(Si) thin films show high dielectric constant [(εr)PZT=400-425], low leakage current density (Je<2 × 10-7 A/cm 2), and good ferroelectric properties (Pr = 15 μC/cm2, Ec=157 kV/cm), while the PZT/BMT/Si thin films exhibit a large optical refractive index (nPZT/BMT/si=2.4).

Original languageEnglish
Pages (from-to)5701-5705
Number of pages5
JournalJournal of Applied Physics
Volume96
Issue number10
DOIs
StatePublished - 15 Nov 2004

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