Characteristic Voltage of Programmed Metal-to-Metal Antifuses

G. Zhang, P. Yu, Chen-Ming Hu, S. Chiang, E. Hamdy

Research output: Contribution to journalArticle

14 Scopus citations

Abstract

The characteristic voltage V f of different programmed metal-to-metal antifuses was measured and found to be nearly independent of the electrode materials. An electrothermal model, used previously to predict programmed silicon-electrode antifuse resistance, was extended to explain the above phenomenon. The metal-to-metal antifuse resistance vs, the programming current is governed by the Wiedeman-Franz Law.

Original languageEnglish
Pages (from-to)166-168
Number of pages3
JournalIEEE Electron Device Letters
Volume15
Issue number5
DOIs
StatePublished - 1 Jan 1994

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