Channel backscattering characteristics of uniaxially strained nanoscale CMOSFETs

Hong Nien Lin*, Hung Wei Chen, Chih Hsin Ko, Chung Hu Ge, Horng-Chih Lin, Tiao Yuan Huang, Wen Chin Lee

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

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Chemical Compounds

Engineering & Materials Science