CARRIER TUNNELING RELATED PHENOMENA IN THIN OXIDE MOSFET's.

C. Chang*, M. S. Liang, Chen-Ming Hu, R. W. Brodersen

*Corresponding author for this work

Research output: Contribution to journalConference article

19 Scopus citations
Original languageEnglish
Pages (from-to)194-197
Number of pages4
JournalTechnical Digest - International Electron Devices Meeting
DOIs
StatePublished - 1 Dec 1983

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