Capability measures for processes with multiple characteristics

K. S. Chen, W.l. Pearn*, P. C. Lin

*Corresponding author for this work

Research output: Contribution to journalArticle

90 Scopus citations

Abstract

Process capability indices, such as Cp, Ca, and Cpk, have been widely used in the manufacturing industry providing numerical measures on process precision, process accuracy, and process performance. Capability measures for processes with a single characteristic have been investigated extensively. However, capability measures for processes with multiple characteristics are comparatively neglected. In this paper, we consider a generalization of the yield index Spk proposed by Boyles, for processes with multiple characteristics. We establish a relationship between the generalization and the process yield. We also develop a control chart based on the proposed generalization, which displays all the characteristic measures in one single chart. Using the chart, the engineers can effectively monitor and control the performance of all process characteristics simultaneously.

Original languageEnglish
Pages (from-to)101-110
Number of pages10
JournalQuality and Reliability Engineering International
Volume19
Issue number2
DOIs
StatePublished - 1 Mar 2003

Keywords

  • Capability zone
  • MCPCA chart
  • Multiple characteristics
  • Process capability index
  • Process yield index

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