Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing

W.l. Pearn*, K. S. Chen

*Corresponding author for this work

Research output: Contribution to journalArticle

47 Scopus citations

Abstract

Process capability indices Cp(u, v), which include the four basic indices Cp, Cpk, Cpm and Cpmk as special cases, have been proposed to measure process potential and performance. Cp(u, v) are appropriate indices for processes with normal distributions, but have been shown to be inappropriate for processes with non-normal distributions. In this paper, we first consider two generalizations of Cp(u, v), which we refer to as CNp(u, v) and C′Np(u, v), to cover cases where the underlying distributions may not be normal. Comparisons between CNp(u, v) and C′Np(u, v) are provided. The results indicated that the generalizations CNp(u, v) are superior to C′Np(u, v) in measuring process capability. We then present a case study on an aluminum electrolytic-capacitor manufacturing process to illustrate how the generalizations CNp(u, v) may be applied to actual data collected from the factories.

Original languageEnglish
Pages (from-to)1853-1858
Number of pages6
JournalMicroelectronics Reliability
Volume37
Issue number12
DOIs
StatePublished - 1 Jan 1997

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